TJS TEST SYSTEMS
TJS TEST SYSTEMS
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  • Products
    • Opto Isolators (CAN, LIN)
    • Automotive Transients
    • EFT, SURGE and DIPS
    • Conducted RF and BCI
    • Conducted Emissions
    • Radiated Immunity
    • Radiated Emissions
    • Ground Planes & Tables
  • Contact Us
  • More
    • Home
    • Products
      • Opto Isolators (CAN, LIN)
      • Automotive Transients
      • EFT, SURGE and DIPS
      • Conducted RF and BCI
      • Conducted Emissions
      • Radiated Immunity
      • Radiated Emissions
      • Ground Planes & Tables
    • Contact Us
  • Home
  • Products
    • Opto Isolators (CAN, LIN)
    • Automotive Transients
    • EFT, SURGE and DIPS
    • Conducted RF and BCI
    • Conducted Emissions
    • Radiated Immunity
    • Radiated Emissions
    • Ground Planes & Tables
  • Contact Us

Conducted RF & BCI Test Systems

Conducted RF Test Systems

System customizable with a combination of below specification:


Covers below tests and standards:

IEC 61000-4-6, NAMUR and EN


Frequency: 9 kHz to 80 MHz or 230 MHz


Test Voltage Levels:

CDN: 1 V to 30 V or higher

EM Clamp: 1 V to 15 V or higher


Power Line CDN Ratings:

Type M1, M2, M3, M4 and M5

 upto 1000 VAC, 2000 VDC

upto 125 A


Signal Line CDN Ratings:

Type AF, S, and T

Bulk Current Injection Test Systems

System customizable with a combination of below specification:


Covers below tests and standards:

AIS-004, ISO 11452-4, UN ECE R10 and OEM


Frequency: 100 kHz to 400 MHz upto 2 GHz


Test Voltage Levels:

BCI Probe: 20 mA to 300 mA and above

Substitution and Closed Loop Method


with BCI Probe and Calibration Jig

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CIN: U26512GJ2023PTC139033, GST: 24AAJCT9655Q1ZC


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